Contour and roughness measuring device (Mitutoyo Surftest SJ 500P)

The surface measuring instrument “Surftest SJ-500” from Mitutoyo is an electrical stylus instrument for the determination of all common form and roughness parameters.

The use of different mechanical probes allows testing in wide fields of application. In addition to roughness measurement, the contour measurement components complete the performance spectrum of this device.

Contour measurement includes the determination of angles, radii, distances and coordinates as well as the computer-controlled target/actual comparison with measured or calculated profile specifications. In conjunction with versatile evaluation options, this allows statements to be made about the micro- and macro-shape that go well beyond those of conventional roughness measurement variables.

Parameter

Max. Measuring range:

50 mm

Measurement speed:

0.02 – 5 mm/s

Profile:

Primary profile (P), roughness profile (R), waviness (W), R-motif, W-motif and more.

Straightness:

0.2 µm / 50 mm

Measurement method:

Reference plane system – inductive

Measuring range:

800 µm; 80 µm; 8 µm (up to 2.4 mm with optional probe)

Alignment:

±1.5° (tilt) 30 mm (height adjustment)

Probe Tip:

Diamond, (angle 60°, radius 2 µm; meskrfat 0.75 mN)

Standards:

DIN EN ISO, VDA, JIS, ANSI and user-def. Conditions

Digital filter:

Gauss, 2CR75, PC75, RobustSpline

Standard tests
  • Determination of roughness parameters Ra, Rz, Rmax according to DIN 4768
  • Roughness measurements: Parameters RK, RPK, RVK, Mr1, Mr2 to describe the material portion in the roughness profile; DIN 4776
  • of the roughness parameters Rp, Pt, Rz ISO, R3z, RMr, Rsm, Psm, Pmr, Wt, Sk, Pc,
  • Determination of characteristic curves: profile, material proportion (Abott-Firestone), amplitude density, PW profile representation